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  • Ning Cao
    *[[Ellipsometer (Woollam)|J.A. Woolam Ellipsometer - Thin-Film optical measurement & characterization]]
    899 bytes (108 words) - 12:18, 24 March 2020
  • Ellipsometer (Woollam)
    |description = Woolam Spectroscopic Ellipsometer The Woolam M-2000DI Variable Angle Spectroscopic Ellipsometer is used for the general characterization of optical thin films using ellips
    2 KB (333 words) - 15:37, 12 February 2024
  • Ellipsometer (Rudolph)
    |picture=Ellipsometer.jpg |description = Ellipsometer
    1 KB (186 words) - 23:06, 10 October 2018
  • DS-K101-304 Bake Temp. versus Develop Rate
    Checked thickness on the ellipsometer, developed in 300MIF for 30s and check thickness again.
    543 bytes (82 words) - 14:02, 2 October 2019
  • Optical Film Spectra + Optical Properties (Filmetrics F10-RT-UVX)
    ...ve index data, we recommend using the [[Ellipsometer (Woollam)|J.A. Woolam Ellipsometer]], while The F10-RT will provide higher accuracy for thicker films and mult
    2 KB (268 words) - 10:04, 13 September 2022
  • Ellipsometer (Woollam) - Measuring thin metals with oxide pre-measurement
    |'''Ellipsometer: pre-measure before dep''' |'''Ellipsometer: measure after dep'''
    2 KB (343 words) - 15:39, 12 February 2024
  • Ellipsometer (Woollam) - Measuring thin dielectrics with Native Oxide pre-measurement
    Detailed steps can be found in [[Ellipsometer (Woollam) - Measuring thin metals with oxide pre-measurement]], but instead
    1 KB (200 words) - 12:44, 26 April 2023
  • IBD: Calibrating Optical Thickness
    ...and TaO films, using single-deps and [[Ellipsometer (Woollam)|J.A. Woolam Ellipsometer]] or equivalent tool. Approx. rate from previous user is also acceptable.
    5 KB (758 words) - 10:19, 9 March 2024
  • Laser Etch Monitoring
    ...ilmetrics systems]] - also similar to the [[Ellipsometer (Woollam)|Woollam ellipsometer]], but different technique). However, instead of varying the optical wavel
    8 KB (1,293 words) - 15:09, 6 December 2023
  • Tool List
    *[[Ellipsometer (Woollam)]]
    7 KB (844 words) - 11:52, 1 March 2024
  • Frequently Asked Questions
    ...or example, complex analysis software such as the [[Ellipsometer (Woollam)|Ellipsometer]] and [[Atomic Force Microscope (Bruker ICON)|AFM]] manuals are available o
    25 KB (4,184 words) - 08:59, 21 November 2023
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