Difference between revisions of "Surface Analysis (KLA/Tencor Surfscan)"
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==Documentation== | ==Documentation== | ||
+ | |||
*[[KLA-Tencor Surfscan - Standard Operating Procedure|Standard Operating Procedure]] | *[[KLA-Tencor Surfscan - Standard Operating Procedure|Standard Operating Procedure]] | ||
*[https://wiki.nanotech.ucsb.edu/w/images/9/96/Surfscan-Operation-Manual.pdf Operations Manual] | *[https://wiki.nanotech.ucsb.edu/w/images/9/96/Surfscan-Operation-Manual.pdf Operations Manual] | ||
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*[[Wafer scanning process traveler]] | *[[Wafer scanning process traveler]] | ||
*[[Glossary]] | *[[Glossary]] | ||
− | *Errors | + | *[[Errors]] |
+ | |||
+ | <br /> | ||
+ | |||
+ | == Examples == | ||
+ | <br /> | ||
+ | {| class="wikitable" | ||
+ | |+A low-particle 4-inch wafer example: | ||
+ | !Gain 4: Small Particles | ||
+ | (0.160µm – 1.60µm) | ||
+ | !Gain 2: Large Particles | ||
+ | (1.60µm – 28.0µm) | ||
+ | |- | ||
+ | |[[File:Surfscan Low-Particle Example - G4.png|frameless|200x200px]] | ||
+ | |[[File:Surfscan Low-Particle Example - G2.png|frameless|200x200px]] | ||
+ | |} | ||
+ | {| class="wikitable" | ||
+ | |+A high-particle 4-inch wafer example: | ||
+ | !Gain 4: Small Particles | ||
+ | (0.160µm – 1.60µm) | ||
+ | !Gain 2: Large Particles | ||
+ | (1.60µm – 28.0µm) | ||
+ | |- | ||
+ | |''To Be Added'' | ||
+ | |''To Be Added'' | ||
+ | |} |
Revision as of 15:09, 18 November 2021
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About
This system uses a laser-based scattering method to count size and distribution of particles (or other scattering defects) on a flat wafer surface. It can scan wafers in size from 4 to 8 inches.
Documentation
- Standard Operating Procedure
- Operations Manual
- For detailed measurement info, it is highly recommended that you read the manual.
- Wafer scanning process traveler
- Glossary
- Errors
Examples
Gain 4: Small Particles
(0.160µm – 1.60µm) |
Gain 2: Large Particles
(1.60µm – 28.0µm) |
---|---|
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Gain 4: Small Particles
(0.160µm – 1.60µm) |
Gain 2: Large Particles
(1.60µm – 28.0µm) |
---|---|
To Be Added | To Be Added |