Difference between revisions of "Surface Analysis (KLA/Tencor Surfscan)"

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==Documentation==
 
==Documentation==
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*[[KLA-Tencor Surfscan - Standard Operating Procedure|Standard Operating Procedure]]
 
*[[KLA-Tencor Surfscan - Standard Operating Procedure|Standard Operating Procedure]]
*[//wiki.nanotech.ucsb.edu/w/images/9/96/Surfscan-Operation-Manual.pdf Operations Manual]
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*[https://wiki.nanotech.ucsb.edu/w/images/9/96/Surfscan-Operation-Manual.pdf Operations Manual]
 
**''For detailed measurement info, it is highly recommended that you read the manual.''
 
**''For detailed measurement info, it is highly recommended that you read the manual.''
*[//wiki.nanotech.ucsb.edu/w/images/2/27/Surfscan-Surfscan_6200_info.pdf Surfscan Info]
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*[[Wafer scanning process traveler]]
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*[[Glossary]]
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*[[Errors]]
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<br />
  
=== Screenshots ===
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== Examples ==
[[File:UCSBTEST.png|left|thumb|'''UCSBTEST2'''  for big size particles '''(1.6-28.0)um''']][[File:UCSBTEST2 for small particles.png|left|thumb|'''UCSBTEST2''' for small size particles '''(0.16-1.6)um''']]
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<br />
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{| class="wikitable"
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|+A low-particle 4-inch wafer example:
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!Gain 4: Small Particles
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(0.160µm – 1.60µm)
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!Gain 2: Large Particles
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(1.60µm – 28.0µm)
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|-
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|[[File:Surfscan Low-Particle Example - G4.png|frameless|200x200px]]
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|[[File:Surfscan Low-Particle Example - G2.png|frameless|200x200px]]
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|}
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{| class="wikitable"
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|+A high-particle 4-inch wafer example:
 +
!Gain 4: Small Particles
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(0.160µm – 1.60µm)
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!Gain 2: Large Particles
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(1.60µm – 28.0µm)
 +
|-
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|''To Be Added''
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|''To Be Added''
 +
|}

Latest revision as of 15:09, 18 November 2021

Surface Analysis (KLA/Tencor Surfscan)
KLA.jpg
Tool Type Inspection, Test and Characterization
Location Bay 5
Supervisor Biljana Stamenic
Supervisor Phone (805) 893-4002
Supervisor E-Mail biljana@ece.ucsb.edu
Description Surface Analysis
KLA/Tencor Surfscan 
Manufacturer Tencor


About

This system uses a laser-based scattering method to count size and distribution of particles (or other scattering defects) on a flat wafer surface. It can scan wafers in size from 4 to 8 inches.

Documentation


Examples


A low-particle 4-inch wafer example:
Gain 4: Small Particles

(0.160µm – 1.60µm)

Gain 2: Large Particles

(1.60µm – 28.0µm)

Surfscan Low-Particle Example - G4.png Surfscan Low-Particle Example - G2.png
A high-particle 4-inch wafer example:
Gain 4: Small Particles

(0.160µm – 1.60µm)

Gain 2: Large Particles

(1.60µm – 28.0µm)

To Be Added To Be Added