Difference between revisions of "SEM Sample Coater (Hummer)"

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(added more info and placeholder for SOP and link to techniqures to reduce chargign)
(Instructions)
 
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{{tool|{{PAGENAME}}
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{{tool2|{{PAGENAME}}
 
|picture=SEMSample.jpg
 
|picture=SEMSample.jpg
 
|type = Inspection, Test and Characterization
 
|type = Inspection, Test and Characterization
|super= Don Freeborn
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|super= Michael Barreraz
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|super2= Tony Bosch
 
|location=Bay 1
 
|location=Bay 1
 
|description =  
 
|description =  
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This system is for coating Pd/Au thin layers onto samples that will charge during FESEM inspection.
 
This system is for coating Pd/Au thin layers onto samples that will charge during FESEM inspection.
  
=== When to use ===
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===When to use===
 
If you tried SEM'ing a sample, and the sample appears to drift/move during imaging/capture, or astigmatism is constantly changing, then your sample may be charging up and deflecting the electron beams.  This is common for imaging insulators such as substrates made of glass (SiO2), or substrates coated in glass (SiO2, SiN) or thick photoresist (≥1µm).  Thin layers (<<1µm) on top of conductive substrates (eg. 200nm SiO2 on Silicon substrate) can often allow electron beams and fields to penetrate to the conductor, possibly not requiring AuPd coating.  
 
If you tried SEM'ing a sample, and the sample appears to drift/move during imaging/capture, or astigmatism is constantly changing, then your sample may be charging up and deflecting the electron beams.  This is common for imaging insulators such as substrates made of glass (SiO2), or substrates coated in glass (SiO2, SiN) or thick photoresist (≥1µm).  Thin layers (<<1µm) on top of conductive substrates (eg. 200nm SiO2 on Silicon substrate) can often allow electron beams and fields to penetrate to the conductor, possibly not requiring AuPd coating.  
  
== Operating Procedures ==
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==Operating Procedures==
{{Todo|Upload SOP.  Printouts available at tool.}}
 
  
* [[Hummer SEM Sample Coater - Techniques to reduce charging in SEMs|Techniques to reduce charging in SEMs]]
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[https://wiki.nanotech.ucsb.edu/w/images/5/5d/SEM_sample_coater_%28hummer%29_instructions.pdf SEM Sample Coater (Hummer) Instructions]
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*[[Hummer SEM Sample Coater - Techniques to reduce charging in SEMs|Techniques to reduce charging in SEMs]]
  
 
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Latest revision as of 14:10, 21 September 2022

SEM Sample Coater (Hummer)
SEMSample.jpg
Location Bay 1
Tool Type Inspection, Test and Characterization
Manufacturer Hummer

Primary Supervisor Michael Barreraz
(805) 893-4147
mikebarreraz@ece.ucsb.edu

Secondary Supervisor

Tony Bosch


Recipes N/A


About

This system is for coating Pd/Au thin layers onto samples that will charge during FESEM inspection.

When to use

If you tried SEM'ing a sample, and the sample appears to drift/move during imaging/capture, or astigmatism is constantly changing, then your sample may be charging up and deflecting the electron beams. This is common for imaging insulators such as substrates made of glass (SiO2), or substrates coated in glass (SiO2, SiN) or thick photoresist (≥1µm). Thin layers (<<1µm) on top of conductive substrates (eg. 200nm SiO2 on Silicon substrate) can often allow electron beams and fields to penetrate to the conductor, possibly not requiring AuPd coating.

Operating Procedures

SEM Sample Coater (Hummer) Instructions