Surface Analysis (KLA/Tencor Surfscan)

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Surface Analysis (KLA/Tencor Surfscan)
KLA.jpg
Tool Type Inspection, Test and Characterization
Location Bay 5
Supervisor Tom Reynolds
Supervisor Phone (805) 893-8158
Supervisor E-Mail reynolds@ece.ucsb.edu
Description ?
Manufacturer Tencor


About

This system uses a laser-based scattering method to count size and distribution of particles (or other scattering defects) on a flat wafer surface.

Documentation

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