Difference between revisions of "ICP Etch 1 (Panasonic E626I)"

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|picture=ICP2.jpg
 
|picture=ICP2.jpg
 
|type = Dry Etch
 
|type = Dry Etch
|super= Don Freeborn
+
|super= Lee Sawyer
 
|location=Bay 2
 
|location=Bay 2
|description = ?
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|description = ICP Etching and Ashing Multi-Chamber Tool
 
|manufacturer = Panasonic Factory Solutions, Japan
 
|manufacturer = Panasonic Factory Solutions, Japan
 
|materials =  
 
|materials =  
 
|toolid=22
 
|toolid=22
 
}}  
 
}}  
= About =
+
==About==
  
 +
This is a three-chamber tool for etching of a variety of materials.
  
This is a mu-chamber tool for etching of a variety of materials. The chamber is configured as an ICP etching tool with 1250 W ICP power, 600 W RF substrate power, and RT-80°C operation with back-side He cooling and an electrostatic chuck to maintain controlled surface temperatures during etching. This chamber has Cl<sub>2</sub>, BCl<sub>3</sub>, CF<sub>4</sub>, CHF<sub>3</sub>, SF<sub>6</sub>, Ar, N<sub>2</sub>, He, and O<sub>2</sub> for gas sources and can be used to etch a variety of materials from SiO<sub>2</sub> to metals to compound semiconductors. The chamber evacuated with a 2000 lpm Osaka Vacuum magnetically levitated turbo pump, allowing for fast pump down. The system accepts 6” wafers (JEIDA Std) or pieces mounted to the wafers.
+
Chamber one "Etch Chamber" is configured as an ICP etching tool with 1000 W ICP power, 500 W RF substrate power, and RT - 80°C operation with back-side He cooling and an electrostatic chuck to maintain controlled surface temperatures during etching.  
  
= Detailed Specifications =
+
This chamber has the following dedicated gas sources: Cl<sub>2</sub>, BCl<sub>3</sub>, and O<sub>2</sub>  
  
*1250 W ICP source, 600 W RF Sample Bias Source in etching chamber
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The chamber also has the following gas sources, where two of the lines must be manually switched between the two options shown (gasses can't be used simultaneously): N<sub>2</sub>/He, CHF<sub>3</sub>/Ar and CF<sub>4</sub> /SF<sub>6</sub>
*RT - 80°C sample temperature for etching
+
 
 +
The system can be used to etch a variety of materials from SiO<sub>2</sub> to metals to compound semiconductors. The chamber is evacuated with a 2000 lpm Osaka Vacuum magnetically levitated turbo pump, and is load-locked for fast pump down.
 +
 
 +
The in-situ laser monitor installed on the etch chamber allows for repeatable etches and endpoint detection via continuous optical monitoring of the wafer reflectivity in a user-determined location, through a porthole on the chamber. 
 +
 
 +
Chamber two, "Ashing Chamber" is a 2000 W ICP chamber configures for plasma "ashing" of photoresist and other materials such as BCB. The substrate is not biased for isotropic etching, and the chamber has CF<sub>4</sub> and O<sub>2</sub> for the gases. This is especially well-suited for omni-directional etching of photoresist/PR removal, or BCB etch-back.
 +
 
 +
Chamber three "Rinse Chamber" is a DI rinsing chamber that is not used/offline.
 +
 
 +
The system accepts 6” wafers with SEMI-std. flats. Users often mount smaller pieces to the wafers, usually with easily removable oil to improve uniform heat-sinking.
 +
 
 +
In Automatic mode, multiple wafers can be run through automatically with the cassette-based system.
 +
 
 +
==Detailed Specifications==
 +
 
 +
*1000 W ICP source, 500 W RF Sample Bias Source in etching chamber
 +
*Multiple 6” diameter wafer capable system
 +
*Pieces possible by mounting to 6” wafer
 +
 
 +
<u>Etch Chamber:</u>
 +
 
 +
*Optimal Emission Monitoring
 
*Etch pressure from 0.1 Pa to 5 Pa (0.75 mT - 37.5 mT)
 
*Etch pressure from 0.1 Pa to 5 Pa (0.75 mT - 37.5 mT)
*Cl<sub>2</sub>, BCl<sub>3</sub>, CF<sub>4</sub>, CHF<sub>3</sub>, SF<sub>6</sub>, Ar, N<sub>2</sub>, He, and O<sub>2</sub> in etch chamber
+
*Cl<sub>2</sub>, BCl<sub>3</sub>, O<sub>2,</sub> (CHF<sub>3</sub> or Ar), (CF<sub>4</sub> or SF<sub>6</sub>), and (N<sub>2</sub> or He) in etch chamber
*Pieces possible by mounting to 6” wafer
+
*Room Temp - 80°C sample temperature for etching. Default 12°C Chuck Temperature.
*Load-Locked
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*Laser Etch Monitoring: [[Laser Etch Monitoring|Intellemetrics LEP 500]]
*Up to 20 steps per recipe
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*Laser monitor with 679.60nm wavelength
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<u>Ashing Chamber:</u>
 +
 
 +
*2000 W ICP ashing chamber
 +
*RT - 250°C sample temperature for ashing
 +
*Ashing pressures 50 mT - 500 mT
 +
*O<sub>2</sub>, N<sub>2</sub>, CF<sub>4</sub>, H<sub>2</sub>O Vapor for ashing chamber
 +
*Room Temp. to 270°C etching.  Default 50°C.
 +
 
 +
==Documentation==
 +
 
 +
*[https://wiki.nanotech.ucsb.edu/w/images/0/0a/ICP_-1_Gas_Change_CF4-SF6-CF4.pdf]{{file|Panasonic 1 instructions.pdf|Panasonic _1_instructions.pdf}}
 +
*[https://wiki.nanotech.ucsb.edu/w/images/0/0a/ICP_-1_Gas_Change_CF4-SF6-CF4.pdf ICP #1 Gas Change Procedure: CF<sub>4</sub>-SF<sub>6</sub>-CF<sub>4</sub>]
 +
*[https://wiki.nanotech.ucsb.edu/w/images/7/7a/ICP_-1_Gas_Change_CHF3-Ar-CHF3.pdf ICP #1 Gas Change Procedure: CHF<sub>3</sub>-Ar-CHF<sub>3</sub>]
 +
*[https://wiki.nanotech.ucsb.edu/w/images/f/fa/ICP_-1_Gas_Change_N2-He-N2.pdf ICP #1 Gas Change Procedure: N<sub>2</sub>-He-N<sub>2</sub>]
 +
*[https://wiki.nanotech.ucsb.edu/w/images/3/3a/ICP_-1_Rules_%26_Important_Notes.pdf ICP #1 Rules and Important Notes]
 +
*[[Laser Etch Monitoring|Laser Etch Monitor procedures]]
 +
 
 +
==Recipes==
  
=Documentation=
+
*[[ICP Etching Recipes#ICP Etch 1 .28Panasonic E626I.29|'''Recipes > Dry Etching > ICP Etch 1''']] page lists all qualified and contributed recipes for this tool.
*{{fl|ICP1-Gas-Change-CHF3-AR.pdf|Gas Change Procedure (CHF3 & AR)}}
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**Starting point recipes for ICP#1
*{{fl|Gas Change CF4-SF6-CF4.pdf|Gas Change Procedure (CF4 & SF6)}}
+
**''Historical Data'' records "calibration" etches to test tool performance.
*{{file|Panasonic 1 instructions.pdf|Panasonic _1_instructions.pdf}}
+
*The [[Dry Etching Recipes|'''Recipes > Dry Etching Recipes''']]
*{{fl|Changing N2 to He.pdf|Gas Change Procedure (N2 & He)}}
+
**Master table lists all contributed dry etches and materials across tools.

Latest revision as of 07:21, 11 September 2021

ICP Etch 1 (Panasonic E626I)
ICP2.jpg
Tool Type Dry Etch
Location Bay 2
Supervisor Lee Sawyer
Supervisor Phone (805) 893-2123
Supervisor E-Mail lee_sawyer@ucsb.edu
Description ICP Etching and Ashing Multi-Chamber Tool
Manufacturer Panasonic Factory Solutions, Japan
Dry Etch Recipes
Sign up for this tool


About

This is a three-chamber tool for etching of a variety of materials.

Chamber one "Etch Chamber" is configured as an ICP etching tool with 1000 W ICP power, 500 W RF substrate power, and RT - 80°C operation with back-side He cooling and an electrostatic chuck to maintain controlled surface temperatures during etching.

This chamber has the following dedicated gas sources: Cl2, BCl3, and O2

The chamber also has the following gas sources, where two of the lines must be manually switched between the two options shown (gasses can't be used simultaneously): N2/He, CHF3/Ar and CF4 /SF6

The system can be used to etch a variety of materials from SiO2 to metals to compound semiconductors. The chamber is evacuated with a 2000 lpm Osaka Vacuum magnetically levitated turbo pump, and is load-locked for fast pump down.

The in-situ laser monitor installed on the etch chamber allows for repeatable etches and endpoint detection via continuous optical monitoring of the wafer reflectivity in a user-determined location, through a porthole on the chamber.

Chamber two, "Ashing Chamber" is a 2000 W ICP chamber configures for plasma "ashing" of photoresist and other materials such as BCB. The substrate is not biased for isotropic etching, and the chamber has CF4 and O2 for the gases. This is especially well-suited for omni-directional etching of photoresist/PR removal, or BCB etch-back.

Chamber three "Rinse Chamber" is a DI rinsing chamber that is not used/offline.

The system accepts 6” wafers with SEMI-std. flats. Users often mount smaller pieces to the wafers, usually with easily removable oil to improve uniform heat-sinking.

In Automatic mode, multiple wafers can be run through automatically with the cassette-based system.

Detailed Specifications

  • 1000 W ICP source, 500 W RF Sample Bias Source in etching chamber
  • Multiple 6” diameter wafer capable system
  • Pieces possible by mounting to 6” wafer

Etch Chamber:

  • Optimal Emission Monitoring
  • Etch pressure from 0.1 Pa to 5 Pa (0.75 mT - 37.5 mT)
  • Cl2, BCl3, O2, (CHF3 or Ar), (CF4 or SF6), and (N2 or He) in etch chamber
  • Room Temp - 80°C sample temperature for etching. Default 12°C Chuck Temperature.
  • Laser Etch Monitoring: Intellemetrics LEP 500

Ashing Chamber:

  • 2000 W ICP ashing chamber
  • RT - 250°C sample temperature for ashing
  • Ashing pressures 50 mT - 500 mT
  • O2, N2, CF4, H2O Vapor for ashing chamber
  • Room Temp. to 270°C etching. Default 50°C.

Documentation

Recipes