Field Emission SEM 2 (JEOL IT800SHL)

Location	Bay 1
Tool Type	Inspection, Test and Characterization
Manufacturer	JEOL USA Inc
Description	JEOL 7600F FESEM

Primary Supervisor	Aidan Hopkins
	(805) 893-2343
	hopkins@ece.ucsb.edu

Secondary Supervisor	Bill Mitchell

Recipes	N/A

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About

The JEOL IT800HSL Field Emission Scanning Electron Microscope is used for imaging a variety of samples made in the facility.

Identical to SEM#1, but with EDAX module added.

Please see the SEM#1 page for main tool details & procedures.