Difference between revisions of "Field Emission SEM 2 (JEOL IT800SHL)"
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Please see the [https://wiki.nanofab.ucsb.edu/wiki/SEM_1_(JEOL_IT800SHL) SEM#1 page] for main tool details. |
Please see the [https://wiki.nanofab.ucsb.edu/wiki/SEM_1_(JEOL_IT800SHL) SEM#1 page] for main tool details. |
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+ | ==EDS Elemental Analysis== |
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| − | *EDS Operating Procedure |
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| + | *[https://wiki.nanofab.ucsb.edu/w/images/3/3a/EDS_SOP.jpg EDS Operating Procedure] |
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Revision as of 15:50, 9 November 2023
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About
The JEOL IT800HSL Field Emission Scanning Electron Microscope is used for imaging a variety of samples made in the facility.
Identical to SEM#1, but with EDAX module added.
Please see the SEM#1 page for main tool details.
