Field Emission SEM 2 (JEOL IT800SHL)

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Field Emission SEM 2 (JEOL IT800SHL)
SEM1 JEOL IT800HSL.jpg
Location Bay 1
Tool Type Inspection, Test and Characterization
Manufacturer JEOL USA Inc
Description JEOL 7600F FESEM
Primary Supervisor Aidan Hopkins
(805) 893-2343
hopkins@ece.ucsb.edu

Secondary Supervisor

Bill Mitchell

Recipes N/A
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About

The JEOL IT800HSL Field Emission Scanning Electron Microscope is used for imaging a variety of samples made in the facility.

Identical to SEM#1, but with EDAX module added.

Please see the SEM#1 page for main tool details & procedures.

EDS Elemental Analysis

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