Difference between revisions of "Wafer scanning process traveler"

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=== Scanning procedure ===
 
=== Scanning procedure ===
 +
 
====Scanning procedure before process calibration====
 
====Scanning procedure before process calibration====
 
 
# Log in (access code is boss)
 
# Log in (access code is boss)
 
# Load desired number of Si wafers to the carrier that says " SURFSCAN" .
 
# Load desired number of Si wafers to the carrier that says " SURFSCAN" .
Line 20: Line 20:
 
# Select "Home" so indexer moves up to loading/unloading positon
 
# Select "Home" so indexer moves up to loading/unloading positon
 
# Wafers are ready for process calibration  
 
# Wafers are ready for process calibration  
 
 
====Scanning procedure after process calibration====
 
====Scanning procedure after process calibration====
 
 
# Log in (access code is boss)
 
# Log in (access code is boss)
 
# Load treated Si wafers to the carrier that says " SURFSCAN" .
 
# Load treated Si wafers to the carrier that says " SURFSCAN" .

Revision as of 16:16, 31 March 2020

The wafers used for process calibration are ordered from SVM. These are 4 inch silicon wafers with low particle count (LPD= light particle detection<100). The box with 25 wafers is stored in the cleanroom and used only for process calibration. Wafers are handled very carefully, because with every loading and unloading some particles will be added.

Scanning procedure

Scanning procedure before process calibration

  1. Log in (access code is boss)
  2. Load desired number of Si wafers to the carrier that says " SURFSCAN" .
  3. Place the carrier with wafers to the right indexer.
  4. Select in the menu option "CAS" (this will read all wafers that are in the carrier)
  5. Load one of standard recipes
  6. Select one of the recipes:
    • UCSB Gain4 ( measuring small particles 0.16-2.8um)
    • UCSB Gain2 ( measuring larger particles 2.8-28um)
  7. Select one of the recipe, modify it if needed, default the bin
  8. Select the wafer you want to scan
  9. Press SCAN
  10. Wait until scan is finished
  11. Record: LPD, particles #1, particles #8, haze
  12. Take a picture of the scan (by phone)
  13. Select "Home" so indexer moves up to loading/unloading positon
  14. Wafers are ready for process calibration

Scanning procedure after process calibration

  1. Log in (access code is boss)
  2. Load treated Si wafers to the carrier that says " SURFSCAN" .
  3. Place the carrier with wafers to the right indexer.
  4. Select in the menu option "CAS" (this will read all wafers that are in the carrier)
  5. Load one of standard recipes
  6. Select one of the recipes :
    • UCSB Gain4 ( measuring small particles 0.16-2.8um)
    • UCSB Gain2 ( measuring larger particles 2.8-28um)
  7. Select one of the recipe, modify it if needed, default the bin
  8. Select the wafer you want to scan
  9. Press SCAN
  10. Wait until scan is finished
  11. Record: LPD, particles #1, particles #8, haze
  12. Take a picture of the scan (by phone)
  13. Select "Home" so indexer moves up to loading/unloading positon
  14. Unload the wafers