Difference between revisions of "Wafer Scanning process Traveler"

From UCSB Nanofab Wiki
Jump to navigation Jump to search
(Scanning wafers)
 
(wafers scanning procedure)
 
(2 intermediate revisions by the same user not shown)
Line 1: Line 1:
 
== Wafers to Use ==
 
== Wafers to Use ==
The wafers for process calibration are ordered from SVM (<nowiki>https://www.svmi.com/</nowiki>). Specification:
+
The wafers for process calibration are ordered from a wafer supplier that sells high grade, quality wafers. these are 4"Si wafers, with low particle count (Particles: <=10 @ >=0.3 microns). Wafers should be handled carefully, because every loading and unloading will add some particulates.  
  
Silicon Wafer
+
Surfscan 6200 (located in bay5) is used for scanning wafers. There are two standard recipes that could be used for scanning wafers: UCSBTEST1 (for scanning 8” wafers) and UCSBTEST2 (for scanning 4"wafers). The recipe UCSBTEST2 is used as a template to create other two standard recipes: "UCSB Gain4" (measuring small particles 0.16-1.6um) and "UCSB Gain2" (measuring larger particles 1.6-28um).
  
Diameter: 100mm
+
We have cassettes only for 4" and 8" wafers. If you plan to scan wafers that have different size, you need to provide your own cassette and calibrate it. If you need to scan wafer pieces, you need to develop your own procedure how to scan it.
 
 
Type/Dopant: P/Boron
 
 
 
Orientation: <100>
 
 
 
Resistivity: 1-30 ohm-cm
 
 
 
Thickness: 525 +/-25 microns
 
 
 
Polished/Etched
 
 
 
Particles: <=10 @ >=0.3 microns
 
 
 
These wafers have low LPD count (LPD= light particle detection, LPD<100).
 
 
 
The box with 25 wafers is stored in the cleanroom and staff use it only for process calibration (you can order same type of wafers for the same purpose). Wafers are handled very carefully, because every loading and unloading of wafers will add some particulates.  
 
 
 
Surfscan 6200 (located in bay5) is used for scanning wafers.  There are two standard recipes that could be used for scanning wafers: UCSBTEST1 (for scanning 8” wafers) and UCSBTEST2 (for scanning 4"wafers). We do not have cassettes for any other size of the wafers. You need to provide your own cassette and calibrate it. If you need to scan wafers pieces, you need to develop your own procedure how to scan it.  
 
  
 
== Scanning procedure for 4" Si wafers ==
 
== Scanning procedure for 4" Si wafers ==
Line 28: Line 10:
 
=== Scan before process calibration ===
 
=== Scan before process calibration ===
 
# Log in (access code is boss)
 
# Log in (access code is boss)
# Load wafers(face up) to the carrier that says " SURFSCAN" .
+
# Load wafers (face up) to the cassette that says " SURFSCAN" .
# Place the carrier with wafers to the right indexer.
+
# Place the cassette with wafers to the right indexer.
 
# In the menu option select "CAS" (this will read all wafers that are in the carrier).
 
# In the menu option select "CAS" (this will read all wafers that are in the carrier).
 
# Go to "Recipes"
 
# Go to "Recipes"
Line 36: Line 18:
 
#* UCSB Gain2 (measuring larger particles 1.6-28um)
 
#* UCSB Gain2 (measuring larger particles 1.6-28um)
 
#** (Recipe "UCSBTEST2" is used as a template to create recipes UCSB Gain2 and UCSB Gain4)
 
#** (Recipe "UCSBTEST2" is used as a template to create recipes UCSB Gain2 and UCSB Gain4)
# View the recipe and modify it if needed ( if recipe modified, select bin split/default).
+
# View the recipe and modify it if needed ( if recipe modified, select bin split/default to save changes).
# Select the wafer in catalog box you want to scan (you can select one wafer or you can scan all wafers).
+
# Select the wafer in catalog box you want to scan (you can select one wafer or you can scan all wafers-AUTO option).
 
# Select START.
 
# Select START.
 
# Wait until scan is finished.
 
# Wait until scan is finished.
# Record: LPD Cnt (sum of all particles #1- #8), particles #1(0.160-0.213)um, particles #8(1.20-1.60)um, haze region(%).
+
# Record:  
 +
#* '''LPD Cnt''' (sum of all particles #1- #8), particles #1(0.160-0.213)um, particles #8(1.20-1.60)um  
 +
#* '''Haze''' (region(%), average(ppm), peak(ppm)).  
 
# Take a picture of the scan (by phone).
 
# Take a picture of the scan (by phone).
 
# Select "Home" so indexer moves up to loading/unloading position.
 
# Select "Home" so indexer moves up to loading/unloading position.
 
# Unload wafers.
 
# Unload wafers.
 
# Log out.
 
# Log out.
 +
 +
=== Scan after process calibration ===
 +
Repeat the same procedure as it was done before process calibration.

Latest revision as of 11:31, 22 April 2020

Wafers to Use

The wafers for process calibration are ordered from a wafer supplier that sells high grade, quality wafers. these are 4"Si wafers, with low particle count (Particles: <=10 @ >=0.3 microns). Wafers should be handled carefully, because every loading and unloading will add some particulates.

Surfscan 6200 (located in bay5) is used for scanning wafers. There are two standard recipes that could be used for scanning wafers: UCSBTEST1 (for scanning 8” wafers) and UCSBTEST2 (for scanning 4"wafers). The recipe UCSBTEST2 is used as a template to create other two standard recipes: "UCSB Gain4" (measuring small particles 0.16-1.6um) and "UCSB Gain2" (measuring larger particles 1.6-28um).

We have cassettes only for 4" and 8" wafers. If you plan to scan wafers that have different size, you need to provide your own cassette and calibrate it. If you need to scan wafer pieces, you need to develop your own procedure how to scan it.

Scanning procedure for 4" Si wafers

Scan before process calibration

  1. Log in (access code is boss)
  2. Load wafers (face up) to the cassette that says " SURFSCAN" .
  3. Place the cassette with wafers to the right indexer.
  4. In the menu option select "CAS" (this will read all wafers that are in the carrier).
  5. Go to "Recipes"
  6. Select one of the recipes:
    • UCSB Gain4 (measuring small particles 0.16-1.6um)
    • UCSB Gain2 (measuring larger particles 1.6-28um)
      • (Recipe "UCSBTEST2" is used as a template to create recipes UCSB Gain2 and UCSB Gain4)
  7. View the recipe and modify it if needed ( if recipe modified, select bin split/default to save changes).
  8. Select the wafer in catalog box you want to scan (you can select one wafer or you can scan all wafers-AUTO option).
  9. Select START.
  10. Wait until scan is finished.
  11. Record:
    • LPD Cnt (sum of all particles #1- #8), particles #1(0.160-0.213)um, particles #8(1.20-1.60)um
    • Haze (region(%), average(ppm), peak(ppm)).
  12. Take a picture of the scan (by phone).
  13. Select "Home" so indexer moves up to loading/unloading position.
  14. Unload wafers.
  15. Log out.

Scan after process calibration

Repeat the same procedure as it was done before process calibration.