Difference between revisions of "Tool List"

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* [[Optical Film Thickness (Filmetrics)]]
 
* [[Optical Film Thickness (Filmetrics)]]
 
* [[Optical Film Thickness (Nanometric)]]
 
* [[Optical Film Thickness (Nanometric)]]
 
* [[Goniometer]]
* [[Atomic Force Microsope (Dimension 3100/Nanoscope IVA)]]
 
 
|width=400|
 
|width=400|
 
* [[Tencor Flexus Film Stress]]
 
* [[Tencor Flexus Film Stress]]
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* [[Photo-emission & IR Microscope (QFI)]]
 
* [[Photo-emission & IR Microscope (QFI)]]
 
* [[Ellipsometer (Woollam)]]
 
* [[Ellipsometer (Woollam)]]
* [[Goniometer]]
 
 
* [[4-Point Probe Resistivity Mapper]]
 
* [[4-Point Probe Resistivity Mapper]]
 
* [[Laser Scanning Confocal M-scope (Olympus LEXT)]]
 
* [[Laser Scanning Confocal M-scope (Olympus LEXT)]]
 
* [[Deep UV Optical Microscope (Olympus)]]
 
* [[Deep UV Optical Microscope (Olympus)]]
 
* [[Atomic Force Microsope (Dimension 3100/Nanoscope IVA)]]
 
|-
 
|-
 
|}
 
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Revision as of 19:27, 10 July 2012

Lithography

Vacuum Deposition

Dry Etch

Wet Processing

Thermal Processing

Packaging

Inspection, Test and Characterization