Difference between revisions of "Tool List"

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=====Photoresists and Lithography Chemicals=====
  
=====Photoresists and Lithography Chemicals=====
   
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*See the [https://www.nanotech.ucsb.edu/wiki/index.php/Lithography_Recipes#Chemicals_Stocked_.2B_Datasheets Chemical Datasheets page].
 +
*See the [https://wiki.nanotech.ucsb.edu/wiki/index.php/Lithography_Recipes#Chemicals_Stocked_.2B_Datasheets Chemical Datasheets page].
 
*[[Automated Coat/Develop System (S-Cubed Flexi)|Auto. Coat/Develop (S-Cubed Flexi)]]
  
*[[Automated Coat/Develop System (S-Cubed Flexi)|Auto. Coat/Develop (S-Cubed Flexi)]]
   
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=====Lithography Support=====
  
=====Lithography Support=====
   
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*The [https://www.nanotech.ucsb.edu/wiki/index.php/Wet_Benches#Spin_Coat_Benches Spinner Benches] have pre-set hotplates at various temperatures appropriate for common photoresist bakes.
 +
*The [https://wiki.nanotech.ucsb.edu/wiki/index.php/Wet_Benches#Spin_Coat_Benches Spinner Benches] have pre-set hotplates at various temperatures appropriate for common photoresist bakes.
 
*[https://signupmonkey.ece.ucsb.edu/wiki/index.php/Wet_Benches#Automated_Wet-processing_Spinners_.28POLOS.29 POLOS spinners] on Develop and Solvent benches
  
*[https://signupmonkey.ece.ucsb.edu/wiki/index.php/Wet_Benches#Automated_Wet-processing_Spinners_.28POLOS.29 POLOS spinners] on Develop and Solvent benches
 
*[[Spin Rinse Dryer (SemiTool)|Spin/Rinse/Dryer]]
  
*[[Spin Rinse Dryer (SemiTool)|Spin/Rinse/Dryer]]
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*[[XeF2 Etch (Xetch)|XeF<sub>2</sub> Etch (Xetch)]]
  
*[[XeF2 Etch (Xetch)|XeF<sub>2</sub> Etch (Xetch)]]
 
*[[Vapor HF Etch]]
  
*[[Vapor HF Etch]]
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**[[Vacuum Oven (YES)]]
  
**[[Vacuum Oven (YES)]]
 
**[[High Temp Oven (Blue M)]]
  
**[[High Temp Oven (Blue M)]]
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|-
  
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|- valign="top"
  
|- valign="top"
 
| width="300" |
  
| width="300" |
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=====Optical/Electron Microscopy=====
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=====Optical Microscopy=====
   
 
*[[Microscopes|Optical Microscopes]]
  
*[[Microscopes|Optical Microscopes]]
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*[[Laser Scanning Confocal M-scope (Olympus LEXT)]]
  
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]]
 
*[[Photo-emission & IR Microscope (QFI)|Photo-emission & Thermal IR Microscope (QFI)]]
  
*[[Photo-emission & IR Microscope (QFI)|Photo-emission & Thermal IR Microscope (QFI)]]
  +
  +
===== Electron Microscopy =====
 
*[[Field Emission SEM 1 (FEI Sirion)]]
  
*[[Field Emission SEM 1 (FEI Sirion)]]
 
*[[Field Emission SEM 2 (JEOL 7600F)]]
  
*[[Field Emission SEM 2 (JEOL 7600F)]]
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**''Sub-micron Particle Counter''
  
**''Sub-micron Particle Counter''
 
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]]
  
*[[Laser Scanning Confocal M-scope (Olympus LEXT)]]
−
*[[Optical Profilometer - White-Light/Phase-Shift Interference (Filmetrics Profilm3D)]]
  
 
| width="400" |
  
| width="400" |
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=====Thin-Film Analysis/Measurement=====
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=====Thin-Film/Material Analysis=====
   
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====== Thickness + Optical Constants ======
 
*[[Ellipsometer (Woollam)]]
  
*[[Ellipsometer (Woollam)]]
⚫
*[[Film Stress (Tencor Flexus)]]
  
⚫
*[[Filmetrics F40-UV Microscope-Mounted|Optical Film Thickness (Microscope-Mounted Filmetrics F-40-UV)]]
  
 
*[[Optical Film Thickness (Filmetrics)|Optical Film Thickness (Filmetrics F20)]]
  
*[[Optical Film Thickness (Filmetrics)|Optical Film Thickness (Filmetrics F20)]]
  ⚫
*[[Filmetrics F40-UV Microscope-Mounted|Optical Film Thickness (Microscope-Mounted Filmetrics F-40-UV)]]
  ⚫
*[[Optical Film Thickness (Nanometric)]]
 
*[[Optical Film Thickness & Wafer-Mapping (Filmetrics F50)]]
  
*[[Optical Film Thickness & Wafer-Mapping (Filmetrics F50)]]
 
*[[Optical Film Spectra + Optical Properties (Filmetrics F10-RT-UVX)|Reflection/Transmission Spectra & Optical Film Thickness (Filmetrics F10-RT-UVX)]]
  
*[[Optical Film Spectra + Optical Properties (Filmetrics F10-RT-UVX)|Reflection/Transmission Spectra & Optical Film Thickness (Filmetrics F10-RT-UVX)]]
  +
⚫
*[[Optical Film Thickness (Nanometric)]]
  
  +
====== Other Properties ======
  ⚫
*[[Film Stress (Tencor Flexus)]]
  ⚫
*[[Photoluminescence PL Setup (Custom)]]
  +
  +
====== Electrical Analysis ======
 
*[[Resistivity Mapper (CDE RESMAP)]]
  
*[[Resistivity Mapper (CDE RESMAP)]]
  ⚫
*[[Probe Station & Curve Tracer]]
   
 
=====Other Tools=====
  
=====Other Tools=====
   
⚫
*[[Probe Station & Curve Tracer]]
  
 
*[[Goniometer]]
  
*[[Goniometer]]
  +
**''Surface hydrophobicity''
⚫
*[[Photoluminescence PL Setup (Custom)]]
  
 
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Revision as of 10:48, 22 May 2020

Lithography

Photoresists and Lithography Chemicals
Contact Aligners (Optical Exposure)
Other Patterning Systems
Steppers (Optical Exposure)
Thermal Processing for Photolithography
Lithography Support

Vacuum Deposition

Physical Vapor Deposition (PVD)
Sputter Deposition
Chemical Vapor Deposition (CVD)

Dry Etch

Reactive Ion Etching (RIE)
Plasma Etching and Cleaning
Etch Monitoring
ICP-RIE
Ion Milling and Reactive Ion Beam Etching
Other Dry Etching

Wet Processing

See the Chemical List page for stocked chemicals such as Developers, Etchants, Solvents etc.

Thermal Processing

Packaging

Inspection, Test and Characterization

Optical Microscopy
Electron Microscopy
Topographical Metrology
Thin-Film/Material Analysis
Thickness + Optical Constants
Other Properties
Electrical Analysis
Other Tools
Retrieved from "https://wiki.nanofab.ucsb.edu/w/index.php?title=Tool_List&oldid=158136"