Difference between revisions of "Test Data of etching SiO2 with CHF3/CF4"
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+ | {| class="wikitable" |
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+ | | colspan="5" |ICP#2: 0.5Pa, 50/900W, CHF3/CF4=10/30 sccm, time=210 sec |
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+ | |- |
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+ | |Date |
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+ | |Sample# |
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+ | |Etch Rate (nm/min) |
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+ | |Etch Selectivity (SiO2/PR) |
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+ | |Averaged Sidewall Angle (<sup>o</sup>) |
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+ | |- |
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+ | |10/5/2018 |
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+ | |SiO2#02 |
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+ | |160 |
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+ | |1.2 |
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+ | |82.1 |
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+ | |} |
Revision as of 11:36, 29 January 2019
ICP#2: 0.5Pa, 50/900W, CHF3/CF4=10/30 sccm, time=210 sec | ||||
Date | Sample# | Etch Rate (nm/min) | Etch Selectivity (SiO2/PR) | Averaged Sidewall Angle (o) |
10/5/2018 | SiO2#02 | 160 | 1.2 | 82.1 |