Difference between revisions of "Stepper 1 (GCA 6300)"

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(link to stepper vs. contact PPT)
 
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{{tool|{{PAGENAME}}
+
{{tool2|{{PAGENAME}}
 
|picture=Stepper1.jpg
 
|picture=Stepper1.jpg
 
|type = Lithography
 
|type = Lithography
 
|super= Biljana Stamenic
 
|super= Biljana Stamenic
  +
|super2= Bill Millerski
|phone=(805)839-3918
 
 
|location=Bay 7
 
|location=Bay 7
|email=biljana@ece.ucsb.edu
 
 
|description = GCA 6300 I-Line Wafer Stepper
 
|description = GCA 6300 I-Line Wafer Stepper
 
|manufacturer = GCA
 
|manufacturer = GCA
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|toolid=37
 
|toolid=37
 
}}
 
}}
= About =
+
=About=
   
 
Our GCA wafer stepper is an i-line (365 nm) step and repeat exposure tool for doing lithography that requires high resolution and/or critical alignment. The system has been modified to accept piece parts (down to ~15 mm x 15 mm) up to 6” diameter wafers using manual wafer loading. The maximum square die size is 14.8mm x 14.8mm. The system has an Olympus 2142 (N.A. = 0.42) lens that reduces the mask image by 5 x and gives an ultimate resolution of ~ 0.5 um in the center of the lens field. The system can easily produce 0.7 um isolated lines across the entire field. Autofocus is used to determine the sample surface relative to the lens, making the focus stable and repeatable for different thickness of wafer. The stages are controlled by stepper motors and laser interferometers. Using the global, manual alignment, better than 0.25 um alignment error is achievable. Using the DFAS local alignment system, alignment error better than 0.15 um is achieved. With the 350 W Hg arc lamp, we get approximately 180 mW/cm² of i-line intensity at the wafer.
 
Our GCA wafer stepper is an i-line (365 nm) step and repeat exposure tool for doing lithography that requires high resolution and/or critical alignment. The system has been modified to accept piece parts (down to ~15 mm x 15 mm) up to 6” diameter wafers using manual wafer loading. The maximum square die size is 14.8mm x 14.8mm. The system has an Olympus 2142 (N.A. = 0.42) lens that reduces the mask image by 5 x and gives an ultimate resolution of ~ 0.5 um in the center of the lens field. The system can easily produce 0.7 um isolated lines across the entire field. Autofocus is used to determine the sample surface relative to the lens, making the focus stable and repeatable for different thickness of wafer. The stages are controlled by stepper motors and laser interferometers. Using the global, manual alignment, better than 0.25 um alignment error is achievable. Using the DFAS local alignment system, alignment error better than 0.15 um is achieved. With the 350 W Hg arc lamp, we get approximately 180 mW/cm² of i-line intensity at the wafer.
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The system is computer controlled with the capability to program and save a wide variety of exposure jobs. We also have unlimited phone support for system problems through a service contract. The laboratory contains a variety of i-line compatible photoresists. SPR955CM-0.9 for 0.7-1.0 um thick positive processes. AZ5214E for 1.0-2.0 um thick image reversal (negative) process. SPR955CM-1.8 for 1.5-2.0 um thick positive processes. SPR220-3 for 2.5-5 um thick positive process. SPR220-7 for > 5 um thick positive processes. AZnLOF5510 for 1.0um and AZnLOF 2020 for 1.5-3 um negative resist process. Shipley LOL-2000 is also used as an underlayer for high resolution lift-off processes.
 
The system is computer controlled with the capability to program and save a wide variety of exposure jobs. We also have unlimited phone support for system problems through a service contract. The laboratory contains a variety of i-line compatible photoresists. SPR955CM-0.9 for 0.7-1.0 um thick positive processes. AZ5214E for 1.0-2.0 um thick image reversal (negative) process. SPR955CM-1.8 for 1.5-2.0 um thick positive processes. SPR220-3 for 2.5-5 um thick positive process. SPR220-7 for > 5 um thick positive processes. AZnLOF5510 for 1.0um and AZnLOF 2020 for 1.5-3 um negative resist process. Shipley LOL-2000 is also used as an underlayer for high resolution lift-off processes.
   
  +
'''Tutorial:''' If you are not familiar with the differences between Contact Litho and Stepper Litho, please review this short tutorial: [https://wiki.nanofab.ucsb.edu/w/images/c/cb/Demis_D_John_-_Stepper_Reticle_Layout_vs_Wafer_Layout.pdf Demis D. John - Stepper_Reticle_Layout_vs_Wafer_Layout.pdf]
= Detailed Specifications =
 
   
 
=Detailed Specifications=
*Lens: Olympus 2142: NA = 0.42; Depth of field = 1.2 um for 0.7 um process
 
  +
*Maximum die size: ~15 mm x 15 mm
 
*Resolution: 500 nm over portion of field; 700 nm over entire field
+
*Lens: Olympus 2142: NA = 0.42; Depth of field = 1.2 um for 0.7 um process
 
*Maximum die size: ~15 mm x 15 mm
*Registration tolerance: Max 0.30 um global alignment; Max 0.15 um local alignment (with care, you can achieve < 0.10 um registration)
 
  +
*Resolution: 500 nm over portion of field; 700 nm over entire field
*Minimum substrate size: ~ 10 x 10 mm
 
 
*Registration tolerance: Max 0.30 um global alignment; Max 0.15 um local alignment (with care, you can achieve < 0.10 um registration)
 
*Minimum substrate size: ~ 10 x 10 mm
 
*Computer programmable recipes saved on hard disk
 
*Computer programmable recipes saved on hard disk
   
= Process Information =
+
=Process Information=
   
*[https://signupmonkey.ece.ucsb.edu/wiki/index.php/Lithography_Recipes#Photolithography_Recipes Process Page: Photolithography Recipes]
+
*[https://signupmonkey.ece.ucsb.edu/w/index.php?title=Lithography_Recipes#Photolithography_Recipes Process Page: Photolithography Recipes]
 
*[[GCA 6300 Mask Making Guidance]] ('''''Work in progress- not ready yet''''')
   
  +
===CAD Files===
= Service Provider =
 
  +
  +
*[https://wiki.nanotech.ucsb.edu/w/images/c/c4/GCA_Stepper_MaskPlate_Master-DarkField_5x.gds Photomask Template: Dark-field (polygons/objects are clear) at 5x Magnification (GDS)]
  +
**''This template is designed to be submitted to the photomask vendor to print as-is, no scaling applied.''
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**''Insert your designs into the template as Instances scaled UP by 5x.''
  +
**''During exposure, set the blades to 90/90 to block out AutoStep200 DFAS openings''
  +
*[[Media:GCA Global Mark.gds|Global Alignment Mark CAD File (GDS)]]
  +
*See the [[Calculators + Utilities#CAD%20Files%20.26%20Templates|Calculators + Utilities > CAD Files & Templates]] page for other useful CAD files, such as overlay verniers, vented fonts etc.
  +
 
=Service Provider=
   
 
*[http://3ctechnical.com/index.html 3C Technical] - The company that services the stepper.
 
*[http://3ctechnical.com/index.html 3C Technical] - The company that services the stepper.
   
= Operating Procedures =
+
=Operating Procedures=
  +
  +
*[https://wiki.nanofab.ucsb.edu/w/images/a/a0/GCA_6300_Running_a_JOB_3.pdf Running the JOB - One Page Instructions] *
  +
*[https://wiki.nanofab.ucsb.edu/w/images/d/d2/GCA_6300_Standard_Operating_Procedure_010524.pdf Standard Operating Procedures] *
  +
*[https://wiki.nanofab.ucsb.edu/w/images/9/93/GCA6300_Optimizing_the_process_6.pdf Optimizing the Process (FEM)] *
  +
*[https://wiki.nanofab.ucsb.edu/w/images/3/32/GCA_6300_Programming_a_Job_7.pdf Programming a Job] *
  +
*[https://wiki.nanofab.ucsb.edu/w/images/3/3d/GCA_6300_-_Commands.pdf GCA 6300 User Accessible Commands] *
 
*[[Troubleshooting and Recovery]]
  +
*[https://wiki.nanofab.ucsb.edu/w/images/5/5a/GCA_6300_Training_Manual-_3-23-2020.pdf Old Training Manual] *
  +
  +
=Staff Procedures=
  +
''These procedures are for Staff use - contact staff if you think you need to run these!''
   
*[[Media:GCA 6300 Training Manual-4-10-2015.pdf|Training Manual]]
+
*[[GCA 6300 Reboot Procedures]]
''In Progress - not ready yet 2019-05-31:''
 
* [[Stepper 1 (GCA 6300) - Standard Operating Procedure|Standard Operating Procedure]]
 
* [[Programming a Job]]
 
* [[GCA 6300 Mask Making Guidance]]
 
* [[GCA 6300 USer Accessible Commands|GCA 6300 User Accessible Commands]]
 
* [[Troubleshooting and Recovery]]
 

Latest revision as of 17:43, 12 February 2024

Stepper 1 (GCA 6300)
Stepper1.jpg
Location Bay 7
Tool Type Lithography
Manufacturer GCA
Description GCA 6300 I-Line Wafer Stepper

Primary Supervisor Biljana Stamenic
(805) 893-4002
biljana@ece.ucsb.edu

Secondary Supervisor

Bill Millerski


Recipes N/A

SignupMonkey: Sign up for this tool


About

Our GCA wafer stepper is an i-line (365 nm) step and repeat exposure tool for doing lithography that requires high resolution and/or critical alignment. The system has been modified to accept piece parts (down to ~15 mm x 15 mm) up to 6” diameter wafers using manual wafer loading. The maximum square die size is 14.8mm x 14.8mm. The system has an Olympus 2142 (N.A. = 0.42) lens that reduces the mask image by 5 x and gives an ultimate resolution of ~ 0.5 um in the center of the lens field. The system can easily produce 0.7 um isolated lines across the entire field. Autofocus is used to determine the sample surface relative to the lens, making the focus stable and repeatable for different thickness of wafer. The stages are controlled by stepper motors and laser interferometers. Using the global, manual alignment, better than 0.25 um alignment error is achievable. Using the DFAS local alignment system, alignment error better than 0.15 um is achieved. With the 350 W Hg arc lamp, we get approximately 180 mW/cm² of i-line intensity at the wafer.

The system is computer controlled with the capability to program and save a wide variety of exposure jobs. We also have unlimited phone support for system problems through a service contract. The laboratory contains a variety of i-line compatible photoresists. SPR955CM-0.9 for 0.7-1.0 um thick positive processes. AZ5214E for 1.0-2.0 um thick image reversal (negative) process. SPR955CM-1.8 for 1.5-2.0 um thick positive processes. SPR220-3 for 2.5-5 um thick positive process. SPR220-7 for > 5 um thick positive processes. AZnLOF5510 for 1.0um and AZnLOF 2020 for 1.5-3 um negative resist process. Shipley LOL-2000 is also used as an underlayer for high resolution lift-off processes.

Tutorial: If you are not familiar with the differences between Contact Litho and Stepper Litho, please review this short tutorial: Demis D. John - Stepper_Reticle_Layout_vs_Wafer_Layout.pdf

Detailed Specifications

  • Lens: Olympus 2142: NA = 0.42; Depth of field = 1.2 um for 0.7 um process
  • Maximum die size: ~15 mm x 15 mm
  • Resolution: 500 nm over portion of field; 700 nm over entire field
  • Registration tolerance: Max 0.30 um global alignment; Max 0.15 um local alignment (with care, you can achieve < 0.10 um registration)
  • Minimum substrate size: ~ 10 x 10 mm
  • Computer programmable recipes saved on hard disk

Process Information

CAD Files

Service Provider

Operating Procedures

Staff Procedures

These procedures are for Staff use - contact staff if you think you need to run these!