Difference between revisions of "Probe Station & Curve Tracer"

From UCSB Nanofab Wiki
Jump to navigation Jump to search
(→‎Equipment Specifications: update Keithley model)
(→‎Equipment Specifications: model numbers, updated details on capbilities)
Line 10: Line 10:
 
|materials =  
 
|materials =  
 
}}  
 
}}  
= About  =
+
== About  ==
The probe station in the cleanroom is set up for up to four-point probing of two terminal and three terminal devices. The probe station is a Signatone station with a 2” diameter vacuum chuck. Four probes are provided. The measurements are taken with an HP xxxx 4-point probe measuring system or on a Tektronix 370A programmable curve tracer. The curve tracer can be controlled by a computer to get portable data. FETs, HBTs, diodes, and contact resistance measurements are typically done on this system. The 370A curve tracer is capable of pulsed and DC operation.
+
The probe station in the cleanroom is set up for up to four-point probing of two terminal and three terminal devices. The probe station is a Signatone station with a 2” diameter vacuum chuck. Four probes are provided. The measurements can taken with various electronic test equipment detailed below, including HP multimeters, a Tektronix Curve-Tracer and a Keithley Source-Meter unit.  
  
=Equipment Specifications=
+
The Curve Tracer & Keithley SMU can be controlled by a computer to get portable data. FETs, HBTs, diodes, and contact resistance measurements are typically done on this system. The 370A curve tracer is capable of pulsed and DC operation.
*4 probe station
+
 
*HP xxxx 4-point resistance meter
+
System is commonly used for characterizing contacts metals and anneals and contact resistances, diode I-V curves, in addition to other electrical measurements to determine optimal fabrication conditions.
*Tektronix 370A computer controlled curve tracer
+
 
*Pulsed and DC characterization of 2 and 3 terminal devices in clean environment
+
==Equipment Specifications==
 +
*4 probe station, reconfigurable electrical connections
 +
**Probe needles available, users may bring their own and install on the manipulators
 +
*2-inch conductive stage with vacuum
 +
*Binocular microscope, low-mag (variable), long working distance.
 +
 
 +
==== Installed Equipment ====
 
*Keithley 2400 Source-Meter unit
 
*Keithley 2400 Source-Meter unit
 
**Current/Voltage/Resistance readbacks, along with 4-point-probe measurements.
 
**Current/Voltage/Resistance readbacks, along with 4-point-probe measurements.
 
** Up to 200V, 1.0A
 
** Up to 200V, 1.0A
 +
*HP 3466A Digital Multimeter
 +
*HP 34401A Multimeter with 4-point resistivity measurement
 +
*Tektronix 370A computer controlled curve tracer
 +
**Pulsed and DC characterization of 2 and 3 terminal devices
 +
*BK Precision 1672 Triple-Output DC Power Supply
 
*Windows PC with:
 
*Windows PC with:
 
**GPIB Connections to the above electrical testing equipment for automated measurements.
 
**GPIB Connections to the above electrical testing equipment for automated measurements.
 
**Labview
 
**Labview
***I-V Curve plotting program available (read-only)
+
***I-V Curve plotting program available (read-only) for Keithley SMU
 +
***Automated program for Tektronix Curve-Tracer
 
**Python(x,y)  
 
**Python(x,y)  
 
***I-V Curve Plotting script with Keithley 2400
 
***I-V Curve Plotting script with Keithley 2400
 
**Matlab
 
**Matlab
 
***I-V Curve Plotting script with Keithley 2400
 
***I-V Curve Plotting script with Keithley 2400
 +
**[https://www.nanotech.ucsb.edu/wiki/index.php/Frequently_Asked_Questions#How_do_I_get_my_files_from_the_NanoFab_computers.3F Nanofiles Sync] for getting your measured data from the computer.

Revision as of 12:16, 26 April 2019

Probe Station & Curve Tracer
ProbeStation.jpg
Tool Type Inspection, Test and Characterization
Location Bay 4
Supervisor Tony Bosch
Supervisor Phone (805) 893-3486
Supervisor E-Mail bosch@ece.ucsb.edu
Description Probe Station
Manufacturer Various


About

The probe station in the cleanroom is set up for up to four-point probing of two terminal and three terminal devices. The probe station is a Signatone station with a 2” diameter vacuum chuck. Four probes are provided. The measurements can taken with various electronic test equipment detailed below, including HP multimeters, a Tektronix Curve-Tracer and a Keithley Source-Meter unit.

The Curve Tracer & Keithley SMU can be controlled by a computer to get portable data. FETs, HBTs, diodes, and contact resistance measurements are typically done on this system. The 370A curve tracer is capable of pulsed and DC operation.

System is commonly used for characterizing contacts metals and anneals and contact resistances, diode I-V curves, in addition to other electrical measurements to determine optimal fabrication conditions.

Equipment Specifications

  • 4 probe station, reconfigurable electrical connections
    • Probe needles available, users may bring their own and install on the manipulators
  • 2-inch conductive stage with vacuum
  • Binocular microscope, low-mag (variable), long working distance.

Installed Equipment

  • Keithley 2400 Source-Meter unit
    • Current/Voltage/Resistance readbacks, along with 4-point-probe measurements.
    • Up to 200V, 1.0A
  • HP 3466A Digital Multimeter
  • HP 34401A Multimeter with 4-point resistivity measurement
  • Tektronix 370A computer controlled curve tracer
    • Pulsed and DC characterization of 2 and 3 terminal devices
  • BK Precision 1672 Triple-Output DC Power Supply
  • Windows PC with:
    • GPIB Connections to the above electrical testing equipment for automated measurements.
    • Labview
      • I-V Curve plotting program available (read-only) for Keithley SMU
      • Automated program for Tektronix Curve-Tracer
    • Python(x,y)
      • I-V Curve Plotting script with Keithley 2400
    • Matlab
      • I-V Curve Plotting script with Keithley 2400
    • Nanofiles Sync for getting your measured data from the computer.