Difference between revisions of "Oxford ICP Etcher - Process Control Data"

From UCSB Nanofab Wiki
Jump to navigation Jump to search
m (removed WIP)
(described basic 'fab process)
Line 1: Line 1:
 
==Data - InP Ridge Etch (Oxford ICP Etcher)==
 
==Data - InP Ridge Etch (Oxford ICP Etcher)==
  +
[[PECVD1-(PlasmaTherm 790)|PECVD SiO2]] hardmask, patterned on [[Stepper 1 (GCA 6300)|Stepper #2 (AutoStep 200)]] & [[ICP Etch 1 (Panasonic E626I)|Panasonic ICP #1]]
 
{| class="wikitable"
 
{| class="wikitable"
| colspan="6" |'''InP Ridge Etch''': 3mT, 800W/65W, Cl2=18, H2=15, CH4=10sccm, time=5min05sec (305sec)
+
| colspan="6" |'''InP Ridge Etch''': 60°C, 3mT, 800W/65W, Cl2=18, H2=15, CH4=10sccm, time=5min05sec (305sec)
 
|-
 
|-
 
|Date
 
|Date

Revision as of 23:09, 13 January 2022

Data - InP Ridge Etch (Oxford ICP Etcher)

PECVD SiO2 hardmask, patterned on Stepper #2 (AutoStep 200) & Panasonic ICP #1

InP Ridge Etch: 60°C, 3mT, 800W/65W, Cl2=18, H2=15, CH4=10sccm, time=5min05sec (305sec)
Date Sample# Etch Rate (nm/min) Etch Selectivity (InP/SiO2) Comments SEM Images
1/11/22 DJ_Cal 0.602 64.6nm left Software timing bugs fixed - new etch rate will appear slightly higher. [1]
1/12/22 DJ_Cal02 0.563 76.4nm left [2]
1/12/22 DJ_Cal03 0.612 71nm left [3]