Difference between revisions of "Lift-Off with DUV Imaging + PMGI Underlayer"

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==Suggested Process for Liftoff==
 
==Suggested Process for Liftoff==
   
* De-H2O Bake (eg. 220°C, 1m+). Optionally Oxygen ash instead.
+
*De-H2O Bake (eg. 220°C, 1m+). Optionally Oxygen ash instead.
* HMDS soak 10s+
+
*HMDS soak 10s+
* Spin PMGI SF-5 @ 4krpm (rcp 7)
+
*Spin PMGI SF-5 @ 4krpm (rcp 7)
** --> POLOS underside clean: 2000rpm, ACE/ISO/N2
+
**--> POLOS underside clean: 2000rpm, ACE/ISO/N2
* PMGI-Bake: 220°C, 3min (BrewerSci lift-pin hotplate).
+
*PMGI-Bake: 220°C, 3min (BrewerSci lift-pin hotplate).
** Recipe "'''''00 220deg, 3min Vac'''''". Enable Vacuum with overhead valve, only for wafer landing and then turn off.
+
**Recipe "'''''00 220deg, 3min Vac'''''". Enable Vacuum with overhead valve, only for wafer landing and then turn off.
* Spin UV-6-0.8 @ rcp 6 (3.5krpm)
+
*Spin UV-6-0.8 @ rcp 6 (3.5krpm)
** --> POLOS underside clean: 2000rpm, ACE/ISO/N2
+
**--> POLOS underside clean: 2000rpm, ACE/ISO/N2
* Soft-Bake = 135°C, 1min (builtin hotplate)
+
*Soft-Bake = 135°C, 1min (builtin hotplate)
* (check underside for particulates)
+
*(check underside for particulates)
* ASML Exposure
+
*ASML Exposure
** -- Default: Exp = 37.5mJ // foc = –0.10
+
**-- Default: Exp = 37.5mJ // foc = –0.10
* (Try this exposure dose - might need to do a FocArray (smaller Image Distribution eg. 5x5) to find proper exposure.
+
*(Try this exposure dose - might need to do a FocArray (smaller Image Distribution eg. 5x5) to find proper exposure.
* PEB = 135°C, 1.5min (built-in hotplate)
+
*PEB = 135°C, 1.5min (built-in hotplate)
* Dev (300MiF) = 50sec (CRITICAL time)
+
*Dev (300MiF) = 50sec (CRITICAL time)
** --> with cassette & H2O dish prepared
+
**--> with cassette & H2O dish prepared
** --> not stirring, instead very slow/gentle lift/drop at various angles or gentle swish
+
**--> not stirring, instead very slow/gentle lift/drop at various angles or gentle swish
* DI rinse : very Gently! Dunk into prepared DI dish, and dump/fill gently 2x. Don’t allow direct hard water to hit PR surface.
+
*DI rinse : very Gently! Dunk into prepared DI dish, and dump/fill gently 2x. Don’t allow direct hard water to hit PR surface.
* PEii Technics O2: 30sec. May increase feature openings.
+
*PEii Technics O2: 30sec. May increase feature openings.
* Metal Evaporation - EBeam#4 or EBeam#1 vertical/4-inch holder
+
*Metal Evaporation - EBeam#4 or EBeam#1 vertical/4-inch holder
* Lift-off in NMP, facing down or vertical.
+
*Lift-off in NMP, facing down or vertical.
   
 
<br />
 
<br />
   
== Examples ==
+
==Examples==
  +
[[File:PMGI+UV6 lift-off SEM - 2017-06-30 DJ.png|alt=SEM of PR cross-section|none|thumb|578x578px|SEM of holes in PR with above process. Lateral measurement of undercut is only approximate because circle may not have been cut through the exact diameter.]]
 
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Revision as of 22:31, 6 September 2019

This process is intended for Deep-UV Exposure on the ASML DUV Stepper. PMGI is used as the underlayer, which is exposed at the same time as the imaging resist.

This process uses PMGI SF-5 @ 4krpm, which spins to about 130nm (maximum metal thickness = 130nm/3 ≈ 45nm) and undercuts laterally about 130-140nm (minimum gap between metals = (2 x 140nm) + 30nm ≈ 350nm).

Tips

Please see our [Bi-Layer Lift-Off Tutorial] to understand the limitations and requirements for good lift-off.

  • Remember that gaps in between adjacent metal traces can lift-off during the develop!
  • Need underlayer thickness 2x to 3x the desired metal thickness.
  • The underlayer will develop laterally from both sides which can lift-off the imaging resist, so:
    • Minimum gap between adjacent metals should then be: less than 0.5 * underlayer thickness
    • Want at least 30-50nm of underlayer width left to support the imaging resist, so the PR doesn't fall over/collapse.
  • Make sure to use a vertical evaporation - EBeam4 or EBeam1. EBeam3 is not vertical.


Suggested Process for Liftoff

  • De-H2O Bake (eg. 220°C, 1m+). Optionally Oxygen ash instead.
  • HMDS soak 10s+
  • Spin PMGI SF-5 @ 4krpm (rcp 7)
    • --> POLOS underside clean: 2000rpm, ACE/ISO/N2
  • PMGI-Bake: 220°C, 3min (BrewerSci lift-pin hotplate).
    • Recipe "00 220deg, 3min Vac". Enable Vacuum with overhead valve, only for wafer landing and then turn off.
  • Spin UV-6-0.8 @ rcp 6 (3.5krpm)
    • --> POLOS underside clean: 2000rpm, ACE/ISO/N2
  • Soft-Bake = 135°C, 1min (builtin hotplate)
  • (check underside for particulates)
  • ASML Exposure
    • -- Default: Exp = 37.5mJ // foc = –0.10
  • (Try this exposure dose - might need to do a FocArray (smaller Image Distribution eg. 5x5) to find proper exposure.
  • PEB = 135°C, 1.5min (built-in hotplate)
  • Dev (300MiF) = 50sec (CRITICAL time)
    • --> with cassette & H2O dish prepared
    • --> not stirring, instead very slow/gentle lift/drop at various angles or gentle swish
  • DI rinse : very Gently! Dunk into prepared DI dish, and dump/fill gently 2x. Don’t allow direct hard water to hit PR surface.
  • PEii Technics O2: 30sec. May increase feature openings.
  • Metal Evaporation - EBeam#4 or EBeam#1 vertical/4-inch holder
  • Lift-off in NMP, facing down or vertical.


Examples

SEM of PR cross-section
SEM of holes in PR with above process. Lateral measurement of undercut is only approximate because circle may not have been cut through the exact diameter.