Filmetrics F40-UV Quick Start

From UCSB Nanofab Wiki
Revision as of 18:08, 17 July 2018 by John d (talk | contribs) (initial quick start. numbering is kinda messe dup, wrote in 10 min!)
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)
Jump to navigation Jump to search

Thin-Film Analyzer, microscope mounted

Photo of the Filmetrics F40-UV Measurement System
Photo of the Filmetrics F40-UV Measurement System
  1. Turn on light source to about 12 o'clock
    1. Optionally wait a few min for light intensity to stabilize.
      Set the light source to 12 o'clock
  2. Open Software "FILMeasure". Activate "Live Video" Tab.
  3. Load "Filmetrics Focus/Reference Wafer" onto stage, avoiding hole
  4. Approximate placement of a 4-inch wafer
  5. Rotate uScope turret to desired microscope objective
  6. Focus on wafer - use edge of blue (SiO2) features.
  7. In "Live Video" tab, make sure wafer is in focus, and black spot (measurement region) is on grey Silicon region only.
  8. Focus on teh bare silicon in the FILMeasure software
  9. Set software Objective to appropriate dropdown, eg. "10x"
  10. Choose objective calibration in software
  11. Click [Baseline…], set to "Si" and [Take Reflectance Standard] & [Next-->]
    1. If a warning about intensity change pops up, ignore it and hit [OK]
  12. Move stage so microscope shoots through hole in stage
  13. Take Background measurement by aiming objective through the hole in the stage.
    Take Background measurement by aiming objective through the hole in the stage.
  14. Click [Take Background] & [Finish]
  15. Focus on your sample/feature of interest & place the black aperture spot on the measurement region. Here we will measure the SiO2 on the Filmetrics Reference Wafer. It is ok to change the objective, just make sure same calibrated objective is chosen before measuring.
  16. Select a recipe from the Dropdown list (ok to discard changes), and Click [Edit Recipe…] to set the layers to approximately what you expect to measure.
    1. Enable the checkbox next to the thicknesses you want it to measure/calculate, and Disable checkboxes next to any values you want the software to use pre-programmed values for.
    2. Optionally enable the check box next to n & k - but only if you know what refractive index and extinction you expect.  If you don't know these values, Disable the "Meas" checkbox for n & k.  When enabled, you'll want to make sure the refractive index (n) is close to the expected value.
  17. Re-Select the correct microscope objective & Click [Measure]
  18. Make sure the blue (measured) and red (calc'd) curves have reasonably good agreement.  Goodness of fit >90% is pretty good.  Refractive Index (n), if calc'd, should be near the expected value for the film.
    1. If fit is bad (low GOF) or refractive index is far off, this measurement is inaccurate.  If Red curve is much too wavy or too smooth, then your guess of thickness was not close enough - [Edit Recipe] & [Analyze] again until you get a good fit.
  19. example spectrum curve fit
    A good fit should show the Calculated (red) curve overlay on top of the Measureed (blue) curve.
  20. Set objective to 10x & Remove Sample
  21. TURN OFF THE LIGHT SOURCE
    1. The halogen light source does die eventually, so prolong the life by turning off when not in use.
    2. If doing repeated measurements, leave a note with date/time.