Difference between revisions of "Filmetrics F40-UV Microscope-Mounted"
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| − | [[File:Filmetrics F40-UV - system pic 01.jpg|alt=Photograph of the system.|thumb|300x300px|Photograph of the |
+ | [[File:Filmetrics F40-UV - system pic 01.jpg|alt=Photograph of the system.|thumb|300x300px|Photograph of the F40-UV microsscope.]] |
== About == |
== About == |
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| − | The Filmetrics F40-UV is a microscope-mounted thin-film measurement system, allowing you to non-descructively measure thin-film thicknesses in small patterned areas on your sample. It is an optical reflectometer, acquiring spectra between 400-900nm with a regular halogen microscope light source. |
+ | The Filmetrics F40-UV is a microscope-mounted thin-film measurement system, allowing you to non-descructively measure thin-film thicknesses in small (patterned) areas on your sample. It is an optical reflectometer, acquiring reflection spectra between 400-900nm optical wavelengths (Vis to Near-IR) with a regular halogen microscope light source. The Filmetrics software then performs curve-fitting to determine the thickness and/or refractive index of the measured films. |
| − | + | It is equipped with 10x, 20x, 50x, 100x and 150x objectives. |
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== Operating Procedures == |
== Operating Procedures == |
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Revision as of 15:04, 16 August 2018
About
The Filmetrics F40-UV is a microscope-mounted thin-film measurement system, allowing you to non-descructively measure thin-film thicknesses in small (patterned) areas on your sample. It is an optical reflectometer, acquiring reflection spectra between 400-900nm optical wavelengths (Vis to Near-IR) with a regular halogen microscope light source. The Filmetrics software then performs curve-fitting to determine the thickness and/or refractive index of the measured films.
It is equipped with 10x, 20x, 50x, 100x and 150x objectives.