Difference between revisions of "Field Emission SEM 2 (JEOL 7600F)"

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|manufacturer = [http://www.jeolusa.com/PRODUCTS/ElectronOptics/ScanningElectronMicroscopesSEM/FESEM/JSM7600F/tabid/544/Default.aspx JEOL USA Inc]
 
|manufacturer = [http://www.jeolusa.com/PRODUCTS/ElectronOptics/ScanningElectronMicroscopesSEM/FESEM/JSM7600F/tabid/544/Default.aspx JEOL USA Inc]
 
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= About =
 
= About =

Revision as of 07:08, 11 July 2012

Field Emission SEM 2 (JEOL 7600F)
JeolFesem.jpg
Tool Type Inspection, Test and Characterization
Location Bay 1
Supervisor Bill Mitchell
Supervisor Phone (805) 893-4974
Supervisor E-Mail mitchell@ece.ucsb.edu
Description JEOL 7600F FESEM
Manufacturer JEOL USA Inc
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About

The JEOL JSM-7600F FESEM is used for imaging a variety of samples made in the facility. For general specifications, see the link to the system above. Our system is equipped with a gentle-beam mode of operation where bias is put on the stage, allowing for high resolution imaging at low electron energies impinging the surface. This is especially useful for imaging low conductivity and insulating materials without the need for conductive layer coatings. The system can accept a 4” wafer, but only 50mm of the wafer is accessible with the stage movement. A retractable LABE detector is also installed for high resolution back-scattered electron imaging.